The X and Z series of SciAps can be used to detect low concentration silicon (Si) content in silicon-carbon steel.
Source：本站 Time：2019/4/1 10:33:25 frequency：
Nowadays, SciAps X-series (XRF) and Z-series (LIBS) hand-held analyzers are widely used to detect the low concentration of silicon (Si) in silicon-carbon steel.
Both methods can detect 0.05% silicon (Si) in 3 or 5 seconds. Z Series is the first and only recognized LIBS device for PMI testing in the world.
Both methods can detect 0.05% silicon (Si) in 3 or 5 seconds. Z Series is the first and only recognized LIBS device for PMI testing in the world.
